Three main questions:
- What is (nano)metrology?
- Metrology in the sense of quality-assured measurement, i.e. the two concepts – metrological traceability and measurement uncertainty – specifically at the nano-scale (1 nm – 100 nm).
- Why is it important?
- Much has been said about the predicted spectacular growth in nanotechnological production in the coming years: what is less well-known is that nanometrology has a key role in this promised growth.
- What are the challenges to be met?
- Nanotechnology presents a unique opportunity for proactive development of metrology and standards since the technology is still in its infancy.
“Introductory Guide to Nanometrology”, P-E Hansen, G Roebben, L R Pendrill et al. 2011, CO-NANOMET report, ISBN: 978‐0‐9566809‐1‐4, http://www.euspen.eu/content/swf/euspen4/